專利名稱 | 線性位移與傾角同時量測之干涉儀 LINEAR DISPLACEMENT AND TILTING ANGLE MEASURING DEVICE |
申請日 (校編號) | 2008/10/01 (097050US) |
專利證書號 | 7,869,056 美國 |
專利權人 | 國立中央大學 |
發明人 | 梁肇文 |
技術摘要: | ||||||||
A tilting angle measuring device includes an optical device, a four-quadrant optical detector and a computing unit. By the optical device, a light beam emitted by the coherent light source is processed into a reference beam and a test beam. The four-quadrant optical detector has four photoelectric converting units arranged in an array for respectively receiving the reference and test beams. The computing unit is electrically connected to the four-quadrant optical detector for computing a tilting angle of the object with respect to a predetermined position according to four intensity values of the test beam. |
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解決的問題或達成的功效: | ||||||||
The present invention relates to a measuring device, and more particularly to a measuring device for simultaneously measuring the linear displacement and the tilting angle of an object. |
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IPC: | ||||||||
G01B11/14 |
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Claim 1: | ||||||||
1. A tilting angle measuring device for use between a reference surface, an object and a coherent light source, the tilting angle measuring device comprising: an optical device for receiving a light beam emitted by the coherent light source, and splitting the light beam into a first sub-beam and a second sub-beam, directing the first sub-beam to the reference surface such that a third sub-beam is reflected by the reference surface, directing the second sub-beam to the object such that a fourth sub-beam is reflected by the object, and processing the third and fourth sub-beams into a fifth sub-beam and a sixth sub-beam, respectively; a four-quadrant optical detector having four photoelectric converting units arranged in an array for respectively receiving the fifth and sixth sub-beams outputted by the optical device; and a computing unit electrically connected to the four-quadrant optical detector for computing a tilting angle of the object with respect to a predetermined position according to four intensity values of the sixth sub-beam. |
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